yieldWerx

yieldWerx offers end-to-end semiconductor test data analytics solutions, enabling better decision making, root cause analysis, and process improvement. Our products support semiconductor engineers all the way from initial device characterization, to automated yield and quality management and finally RMA analysis. yieldWerx enables product and test engineers with the tools and technologies necessary to characterize new ICs and test programs, speedily ramp up production at OSATs and identify and diagnose yield excursions. yieldWerx PAT is a comprehensive solution for Part Average Testing, in compliance with AEC (Automotive Electronics Council) specifications, managing the complete outlier removal process from initial wafer lot characterization to final-test yield monitoring. yieldWerx PAT is used in production by major semiconductor companies around the world, and is deployed at major OSATs and test houses, to assist in improving the quality of devices used in safety-critical automotive applications. yieldWerx PAT’s outlier algorithms, and modules (SPAT, DPAT, Multivariate PAT, GDBN, etc.) help semiconductor manufacturers minimize their PAT yield loss, quickly identify process shifts, and gain greater control of their chip manufacturing process.